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00000nam2a22000003is4500 |
| 001 |
BY-NLB-br0001709819 |
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20210730161047.0 |
| 100 |
# |
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$a 20210730d1996 |||y0bely50 ba
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| 101 |
0 |
# |
$a eng
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| 102 |
# |
# |
$a US
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| 105 |
# |
# |
$a a ||||000yy
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| 200 |
1 |
# |
$a IBM ASIC design and testing
$f [guest editors: Edward P. Hsieh, Michael D. O'Neill]
|
| 210 |
# |
# |
$a Armonk, NY
$c International Business Machines Corporation
$d 1996
|
| 215 |
# |
# |
$a С. [1], 376―508
$c іл.
$d 28 см
|
| 225 |
2 |
# |
$a IBM journal of research and development
$x 0018-8646
$v vol. 40, № 4
|
| 320 |
# |
# |
$a Бібліяграфія ў канцы артыкулаў
|
| 461 |
# |
1 |
$1 001BY-NLB-br293301
$1 2001
$v 1996,Vol.40,№4
|
| 702 |
# |
1 |
$a Hsieh
$b Edward P.
$4 340
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| 702 |
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1 |
$a O'Neill
$b Michael D.
$4 340
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| 801 |
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$c 20210730
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