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00000nam2a22000003is4500 |
| 001 |
BY-NLB-br0001772853 |
| 005 |
20220602172431.0 |
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$a 20220602e19891989|||y0bely50 ba
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| 101 |
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# |
$a eng
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| 105 |
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# |
$a a ||||100yy
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$a Reliability in electronics
$e selected proceedings of the seventh Symposium on reliability in electronics (Relectronic '88), Budapest, Hungary, 29 August ― 2 September 1988
$f guest editor: A. Balogh
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| 210 |
# |
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$a [S. l.
$c s. n.
$d 1989]
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| 215 |
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$a С. [4], 297―458
$c іл.
$d 26 см
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| 225 |
2 |
# |
$a Microelectronics and reliability
$x 0026-2714
$v vol. 29, № 3
|
| 300 |
# |
# |
$a Выхадныя даныя арыгінала: Oxford [etc.] : Pergamon Press, 1989
|
| 320 |
# |
# |
$a Бібліяграфія ў канцы артыкулаў
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| 461 |
# |
1 |
$1 001BY-NLB-br285233
$1 2001
$v 1989,Vol.29,№3
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| 702 |
# |
1 |
$a Balogh
$b A.
$4 340
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| 711 |
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$a Symposium on reliability in electronics
$d 7
$f 1988
$e Budapest
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