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$a eng
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$a The 1980 Canadian reliability symposium, May 16―17, 1980, Toronto, Ontario, Canada
$e proceedings
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| 210 |
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$a [S. l.
$c s. n.
$d 1980]
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| 215 |
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$a V, 160 с.
$c іл.
$d 26 см
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| 225 |
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# |
$a Microelectronics and reliability
$x 0026-2714
$v vol. 20, № 1/2
|
| 300 |
# |
# |
$a Выхадныя даныя арыгінала: Oxford [etc.] : Pergamon Press, 1980
|
| 320 |
# |
# |
$a Бібліяграфія ў канцы артыкулаў
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| 461 |
# |
1 |
$1 001BY-NLB-br285233
$1 2001
$v 1980,Vol.20,№1/2
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| 710 |
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2 |
$a Canadian reliability symposium
$f 1980
$e Toronto
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| 712 |
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$a Society of Reliability Engineers
$4 557
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| 801 |
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