|
|
|
|
|
00000cam2a22000003is4500 |
| 001 |
BY-NLB-br0001772750 |
| 005 |
20220602160140.0 |
| 010 |
# |
# |
$a 0-08-019788-4
|
| 100 |
# |
# |
$a 20220602e19751975|||y0bely50 ba
|
| 101 |
0 |
# |
$a eng
|
| 105 |
# |
# |
$a a ||||100yy
|
| 200 |
1 |
# |
$a The 1975 Canadian SRE reliability symposium, Saturday May 10, 1975, Ottawa, Ontario, Canada
$e proceedings
|
| 210 |
# |
# |
$a [S. l.
$c s. n.
$d 1975]
|
| 215 |
# |
# |
$a С. [6], 73―237
$c іл.
$d 26 см
|
| 225 |
2 |
# |
$a Microelectronics and reliability
$x 0026-2714
$v vol. 14, № 2
|
| 300 |
# |
# |
$a Выхадныя даныя арыгінала: Oxford [etc.] : Pergamon Press, 1975
|
| 320 |
# |
# |
$a Бібліяграфія ў канцы артыкулаў
|
| 461 |
# |
1 |
$1 001BY-NLB-br285233
$1 2001
$v 1975,Vol.14,№2
|
| 710 |
1 |
2 |
$a Canadian reliability symposium
$f 1975
$e Ottawa
|
| 712 |
0 |
2 |
$a Society of Reliability Engineers
$4 557
|
| 801 |
# |
0 |
$a BY
$b BY-HM0000
$c 20220602
$g RCR
|
