Accuracy barriers of quantitative electron beam x-ray microanalysis: [papers from a workshop on "The accuracy barrier in quantitative EPMA and the role of standards" held at the National Institute of Standards and Technology, April 8―11, 2002 / editors: Dale E. Newbury, Ryna B. Marinenko]
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| Вид документа: | |
|---|---|
| Опубликовано: | Gaithersburg, MD : National Institute of Standards and Technology , 2002 |
| Физические характеристики: |
С. VIII, 483―749 : іл. ; 28 см
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| Язык: | Английский |
| Серия: |
Journal of research of the National Institute of Standards and Technology
vol. 107, № 6 |
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