Accuracy barriers of quantitative electron beam x-ray microanalysis: [papers from a workshop on "The accuracy barrier in quantitative EPMA and the role of standards" held at the National Institute of Standards and Technology, April 8―11, 2002 / editors: Dale E. Newbury, Ryna B. Marinenko]

Сохранено в:
Шифр документа: 3И//208737(050),
Вид документа: Периодические издания
Опубликовано: Gaithersburg, MD : National Institute of Standards and Technology , 2002
Физические характеристики: С. VIII, 483―749 : іл. ; 28 см
Язык: Английский
Серия: Journal of research of the National Institute of Standards and Technology vol. 107, № 6
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