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$a 20210918d1993 |||y0bely50 ba
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$a eng
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$a US
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$a ac ||||000yy
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$a VLSI reliability
$f edited by Chenming Hu
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| 210 |
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$a New York
$c Institute of Electrical and Electronics Engineers
$d 1993
|
| 215 |
# |
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$a С. [2], 651―792
$c іл.
$d 28 см
|
| 225 |
2 |
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$a Proceedings of the IEEE
$f The Institute of Electrical and Electronics Engineers, Inc.
$x 0018-9219
$v vol. 81, № 5
|
| 320 |
# |
# |
$a Бібліяграфія ў канцы артыкулаў
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| 461 |
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$1 001BY-NLB-br287321
$1 2001
$v 1993,Vol.81,№5
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| 517 |
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$a Special issue on VLSI reliability
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| 702 |
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$3 BY-SEK-ar13910862
$a Hu Chenming
$4 340
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