|
|
|
|
|
00000nam2a22000003is4500 |
| 001 |
BY-NLB-br0001717210 |
| 005 |
20210910173135.0 |
| 100 |
# |
# |
$a 20210910e19691969|||y0bely50 ba
|
| 101 |
0 |
# |
$a eng
|
| 105 |
# |
# |
$a a ||||100yy
|
| 200 |
1 |
# |
$a Reliability physics issue
$e [selected papers from the 7th annual Reliability of physics symposium, Washington, D.C., December 2―4, 1968
$f guest editor: Seymour Schwartz]
|
| 210 |
# |
# |
$a [S. l.
$c s. n.
$d 1969]
|
| 215 |
# |
# |
$a С. 321―410
$c іл.
$d 29 см
|
| 225 |
2 |
# |
$a IEEE transactions on electron devices
$v vol. 16, № 4
|
| 300 |
# |
# |
$a Выхадныя даныя арыгінала: New York : Institute of Electrical and Electronics Engineers, 1969
|
| 320 |
# |
# |
$a Бібліяграфія ў канцы артыкулаў
|
| 461 |
# |
1 |
$1 001BY-NLB-br284278
$1 2001
$v 1969,Vol.16,№4
|
| 517 |
0 |
# |
$a Special reliability physics issue
|
| 702 |
# |
1 |
$a Schwartz
$b S.
$g Seymour
$4 340
|
| 801 |
# |
0 |
$a BY
$b BY-HM0000
$c 20210910
$g RCR
|
