Characterization techniques for semiconductor materials, processes, and devices / [guest editors: Martin G. Buehler, W. Murray Bullis]
Guardado en:
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| Publicado: | New York : Institute of Electrical and Electronics Engineers , 1980 |
| Descripción Física: |
С. 2203―2321, 32 : іл. ; 28 см
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| Lenguaje: | Английский |
| Colección: |
IEEE transactions on electron devices
vol. 27, № 12 |
1980, Vol.27,№12: Characterization techniques for semiconductor materials...
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