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00000nam2a22000003is4500 |
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BY-NLB-br0001717574 |
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20210913180336.0 |
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$a 20210913d1998 |||y0bely50 ba
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| 101 |
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# |
$a eng
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| 102 |
# |
# |
$a US
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| 105 |
# |
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$a ac ||||000yy
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| 200 |
1 |
# |
$a Process integration and manufacturability
$f [guest editors: Rajendra Singh et al.]
|
| 210 |
# |
# |
$a New York
$c Institute of Electrical and Electronics Engineers
$d 1998
|
| 215 |
# |
# |
$a С. 573―755
$c іл.
$d 28 см
|
| 225 |
2 |
# |
$a IEEE transactions on electron devices
$x 0018-9383
$v vol. 45, № 3
|
| 320 |
# |
# |
$a Бібліяграфія ў канцы артыкулаў
|
| 461 |
# |
1 |
$1 001BY-NLB-br284278
$1 2001
$v 1998,Vol.45,№3
|
| 517 |
0 |
# |
$a Special issue on process integration and manufacturability
|
| 702 |
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1 |
$a Singh
$b Rajendra
$4 340
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| 801 |
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$g RCR
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