Applications of X-Ray topographic methods to materials science / edited by Sigmund Weissmann, Françoise Balibar and Jean-François Petroff
Сохранено в:
| Вид документа: | |
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| Автор: | Weissmann, Sigmund |
| Опубликовано: | New York London : Plenum Press , 1984 |
| Физические характеристики: |
XIII, 536 c. : іл.
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| Язык: | Английский |
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