Nonlinear-optical diagnostics of semiconductor film crystal structures: Preprint N457
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| Автор: | Balaniuk, V. V. |
| Опубликовано: | Novosibirsk : Institute of Automation and Electrometry Siberian Brabch Ac. Sci , 1990 |
| Физические характеристики: |
8 c.
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| Язык: | Английский |
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